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IEICE Trans

Ryuichi NAKAJIMA

Radiation-Hardened Flip-Flops in a 65 nm Bulk Process for Terrestrial Applications Coping with Radiation Hardness and Performance Overheads
Shotaro SUGITANI Ryuichi NAKAJIMA Keita YOSHIDA Jun FURUTA Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2025/02/01
Vol. E108-C  No. 2  pp. 115-126
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
soft error, Single Event Upset (SEU), critical charge, α-particle, spallation neutron, Flip-Flop, terrestrial environment, 
 Summary | Full Text:PDF
Measuring SET Pulse Widths in pMOSFETs and nMOSFETs Separately by Heavy Ion and Neutron Irradiation
Jun FURUTA Shotaro SUGITANI Ryuichi NAKAJIMA Takafumi ITO Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2024/09/01
Vol. E107-C  No. 9  pp. 255-262
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
single event transient, pulse width, heavy ion, high energy neutron, 
 Summary | Full Text:PDF
Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies
Ryuichi NAKAJIMA Takafumi ITO Shotaro SUGITANI Tomoya KII Mitsunori EBARA Jun FURUTA Kazutoshi KOBAYASHI Mathieu LOUVAT Francois JACQUET Jean-Christophe ELOY Olivier MONTFORT Lionel JURE Vincent HUARD 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2024/07/01
Vol. E107-C  No. 7  pp. 191-200
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
soft error, heavy ion, FD-SOI, 22 nm, flip-flop, guard-gate, radiation-hard, 
 Summary | Full Text:PDF