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IEICE Trans

Ryu HASUNUMA

Time Dependent Percolation Analysis of the Degradation of Coherent Tunneling in Ultra-Thin CoFeB/MgO/CoFeB Magnetic Tunneling Junctions
Keiji HOSOTANI Makoto NAGAMINE Ryu HASUNUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2020/05/01
Vol. E103-C  No. 5  pp. 254-262
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
STT-MRAM, MgO, TDDB, percolation, 
 Summary | Full Text:PDF