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IEICE Trans

Ryoichi INOUE

A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
Ryoichi INOUE Toshinori HOSOKAWA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1  pp. 24-32
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
state-observable FSMs, logical fault testing, timing fault testing, fault sensitization coverage, n-detection, 
 Summary | Full Text:PDF