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IEICE Trans

Ryo TAKEDA

Study on Threshold Voltage Variation Evaluated by Charge-Based Capacitance Measurement
Katsuhiro TSUJI Kazuo TERADA Ryo TAKEDA Hisato FUJISAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/04/01
Vol. E99-C  No. 4  pp. 466-473
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFET, C-V curve, CBCM, threshold voltage, flat-band voltage, variation, 
 Summary | Full Text:PDF