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IEICE Trans

Rong-Sing CHU

A Low-Cost Bit-Error-Rate BIST Circuit for High-Speed ADCs Based on Gray Coding
Ya-Ting SHYU Ying-Zu LIN Rong-Sing CHU Guan-Ying HUANG Soon-Jyh CHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2012/12/01
Vol. E95-A  No. 12  pp. 2415-2423
Type of Manuscript:  PAPER
Category: Analog Signal Processing
Keyword: 
built-in self-test (BIST), bit error rate (BER), analog-to-digital converter (ADC), 
 Summary | Full Text:PDF