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IEICE Trans

Noritaka USAMI

Occurrence Prediction of Dislocation Regions in Photoluminescence Image of Multicrystalline Silicon Wafers Using Transfer Learning of Convolutional Neural Network
Hiroaki KUDO Tetsuya MATSUMOTO Kentaro KUTSUKAKE Noritaka USAMI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2021/06/01
Vol. E104-A  No. 6  pp. 857-865
Type of Manuscript:  Special Section PAPER (Special Section on Image Media Quality)
Category: 
Keyword: 
prediction, transfer learning, convolutional neural network, 
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