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IEICE Trans

Norio MASUDA

Near-Field Magnetic Measurements and Their Application to EMC of Digital Equipment
Takashi HARADA Norio MASUDA Masahiro YAMAGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/01/01
Vol. E89-C  No. 1  pp. 9-15
Type of Manuscript:  INVITED PAPER (Special Section on Near-Field and Far-Field Electromagnetic Absorption and Shielding and Related Technologies)
Category: 
Keyword: 
near field, electromagnetic compatibility, loop probe, printed circuit board, package, 
 Summary | Full Text:PDF