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IEICE Trans

Norio KUJI

EB-Testing-Pad Method and its Evaluation by Actual Devices
Norio KUJI Takako ISHIHARA Shigeru NAKAJIMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10  pp. 1558-1563
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: EB Tester
Keyword: 
E-beam tester, observability, stacked vias, testing pads, multi level wiring, 
 Summary | Full Text:PDF
Improvement of E-Beam Observability by Testing-Pad Placement in LSI Design Layout
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/02/25
Vol. E82-C  No. 2  pp. 387-392
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
E-beam tester, observability, stacked vias, testing pads, multi-level wiring, local field effects, 
 Summary | Full Text:PDF
Guided-Probe Diagnosis of LSIs Containing Macrocells
Norio KUJI Tadao TAKEDA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7  pp. 731-737
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
Keyword: 
electron beam tester, guided-probe diagnosis, macrocell, memory macro, logic simulation, logic model, CAD navigation, 
 Summary | Full Text:PDF
Cone/Block Methods for Logic Simulation Time Reduction in E-Beam Guided-Probe Diagnosis
Norio KUJI Kazuhiro SHIRAKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 560-566
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
logic simulation, cone/block methods, guide-probe diagnosis, electron beam testing, 
 Summary | Full Text:PDF
E-Beam Static Fault Imaging with a CAD Interface and Its Application to Marginal Fault Diagnosis
Norio KUJI Kiyoshi MATSUMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4  pp. 552-559
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
E-beam testing, fault diagnosis, marginal fault, fault image, fault tracing, 
 Summary | Full Text:PDF