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IEICE Trans

Mitsuhiko IGARASHI

An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM
Mitsuhiko IGARASHI Yuuki UCHIDA Yoshio TAKAZAWA Makoto YABUUCHI Yasumasa TSUKAMOTO Koji SHIBUTANI Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2021/11/01
Vol. E104-A  No. 11  pp. 1536-1545
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Systems)
Category: 
Keyword: 
local BTI variation, Ring-Oscillator, 7nm FinFET, SRAM Vmin, 
 Summary | Full Text:PDF