Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2021/02/01
Vol. E104-A
No. 2
pp. 477-483
Type of Manuscript:
INVITED PAPER (Special Section on Analog Circuit Techniques and Related Topics) Category: Keyword: high back-off efficiency, stacked-FET, adaptive bias, adaptive load, CMOS SOI, |