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IEICE Trans

Mathieu LOUVAT

Soft-Error Tolerance by Guard-Gate Structures on Flip-Flops in 22 and 65 nm FD-SOI Technologies
Ryuichi NAKAJIMA Takafumi ITO Shotaro SUGITANI Tomoya KII Mitsunori EBARA Jun FURUTA Kazutoshi KOBAYASHI Mathieu LOUVAT Francois JACQUET Jean-Christophe ELOY Olivier MONTFORT Lionel JURE Vincent HUARD 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2024/07/01
Vol. E107-C  No. 7  pp. 191-200
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
soft error, heavy ion, FD-SOI, 22 nm, flip-flop, guard-gate, radiation-hard, 
 Summary | Full Text:PDF