IEICE Trans

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IEICE Trans

Masao ITO

High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor Fukashi MORISHITA Wataru SAITO Norihito KATO Yoichi IIZUKA Masao ITO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2022/07/01 Vol. E105-C No. 7 pp. 316-323 Type of Manuscript: Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology) Category: Keyword: CMOS image sensor, column-parallel ADC, ramp generator, multi-functional fine pattern generator, IP test,
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FOREWORD Masao ITO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2019/07/01 Vol. E102-C No. 7 pp. 499-500 Type of Manuscript: FOREWORD Category: Keyword:
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A 10-bit 50 MS/s 300 mW A/D Converter Using Reference Feed-Forward Architecture Takashi OKUDA Osamu MATSUMOTO Toshio KUMAMOTO Masao ITO Hiroyuki MOMONO Takahiro MIKI Takeshi TOKUDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/12/25 Vol. E80-C No. 12 pp. 1553-1559 Type of Manuscript: Special Section PAPER (Special Issue on Low-Power and High-Speed LSI Technologies) Category: Keyword: pipelined A/D converter, reference feed-forward architecture, offset cancellation technique, gain matching,
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Static Linearity Error Analysis of Subranging A/D Converters Takashi OKUDA Toshio KUMAMOTO Masao ITO Takahiro MIKI Keisuke OKADA Tadashi SUMI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1996/02/25 Vol. E79-A No. 2 pp. 210-216 Type of Manuscript: Special Section PAPER (Special Section on Analog Technologies in Submicron Era) Category: Keyword: subranging A/D converter, coarse conversion, fine conversion, linearity error,
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