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IEICE Trans

Masakazu MISHINA

A Contraction Algorithm Using a Sign Test for Finding All Solutions of Piecewise-Linear Resistive Circuits
Kiyotaka YAMAMURA Masakazu MISHINA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1996/10/25
Vol. E79-A  No. 10  pp. 1733-1736
Type of Manuscript:  LETTER
Category: Nonlinear Problems
Keyword: 
piecewise-linear resistive circuit, all solutions, sign test, 
 Summary | Full Text:PDF