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IEICE Trans

Masahiro ISHIDA

Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing
Masahiro ISHIDA Toru NAKURA Takashi KUSAKA Satoshi KOMATSU Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/10/01
Vol. E99-C  No. 10  pp. 1219-1225
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
power integrity, power supply voltage control, overkills and underkills, delay fault testing, automatic test equipment, 
 Summary | Full Text:PDF