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IEICE Trans

Maoxiang YI

A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology
Aibin YAN Huaguo LIANG Zhengfeng HUANG Cuiyun JIANG Maoxiang YI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/12/01
Vol. E98-C  No. 12  pp. 1171-1178
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
transient fault, single event upset, soft error, radiation hardening, circuit reliability, 
 Summary | Full Text:PDF