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IEICE Trans

Makoto TAKASHIMA


Single Probe Method with Vector Detection for Measuring Microwave Reflection Coefficient
Takashi IWASAKI Makoto TAKASHIMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 665-671
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: General Methods, Materials, and Passive Circuits
Keyword: 
single probe methodvector detectionmicrowave reflection coefficientsystematic errornetwork analyzer
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