Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2000/08/25
Vol. E83-C
No. 8
pp. 1331-1337
Type of Manuscript:
INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99)) Category: Numerics Keyword: mesh quality, normal offsetting, grid adaptation, moving boundary problem, |