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IEICE Trans

Li REN

Study on Contact Failure Mechanisms of Accelerated Life Test for Relay Reliability
Shujuan WANG Qiong YU Li REN Wanbin REN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/08/01
Vol. E92-C  No. 8  pp. 1034-1039
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices (IS-EMD2008))
Category: Relacys & Switches
Keyword: 
relays, accelerated life test, load current stress, failure mechanism, failure model, 
 Summary | Full Text:PDF