Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/05/01 Vol. E91-CNo. 5pp. 716-720 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: SiGe, MOSFET, PD SOI, stress effect,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/05/01 Vol. E91-CNo. 5pp. 767-771 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: SiGe, SEG, aspect ratio, RPCVD,