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IEICE Trans

Kun-Hsien LIN

MOS-Bounded Diodes for On-Chip ESD Protection in Deep Submicron CMOS Process
Ming-Dou KER Kun-Hsien LIN Che-Hao CHUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/03/01
Vol. E88-C  No. 3  pp. 429-436
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
electrostatic discharge (ESD), diode, poly-bounded diode, MOS-bounded diode, ESD protection, 
 Summary | Full Text:PDF