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IEICE Trans

Koichi TATSUKI


Effect of Purge Gas on the Reliability of a 266 nm Continuous-Wave Solid-State Laser
Hiroyuki WADA Michio OKA Koichi TATSUKI Masaki SAITO Shigeo KUBOTA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/12/01
Vol. E87-C  No. 12  pp. 2186-2188
Type of Manuscript:  LETTER
Category: Lasers, Quantum Electronics
Keyword: 
UV laserreliabilitypurge gasscattering
 Summary | Full Text:PDF