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IEICE Trans

Kiyoshi MURAMORI

High Reliability Design Method of LC Tuning Circuit and Substantiation of Aging Characteristics for 20 Years
Mitsugi SAITA Tatsuo YOSHIE Katsumi WATANABE Kiyoshi MURAMORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1  pp. 213-219
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Evaluation of Reliability Improvement
Keyword: 
LC circuit, electronics parts, inductor, ferrite, ceramic capacitor, aging characteristics, 
 Summary | Full Text:PDF