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IEICE Trans

Kimsrun LIM

Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design
Korkut Kaan TOKGOZ Kimsrun LIM Seitarou KAWAI Nurul FAJRI Kenichi OKADA Akira MATSUZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/01/01
Vol. E98-C  No. 1  pp. 35-44
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
crossing transmission line, de-embedding, characterization, millimeter-wave, reduced port, 
 Summary | Full Text:PDF