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IEICE Trans

Kentaro KOJIMA

Evaluation of Heavy-Ion-Induced Single Event Upset Cross Sections of a 65-nm Thin BOX FD-SOI Flip-Flops Composed of Stacked Inverters
Kentaro KOJIMA Kodai YAMADA Jun FURUTA Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2020/04/01
Vol. E103-C  No. 4  pp. 144-152
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: Electronic Circuits
Keyword: 
single event effect, soft error, heavy ion irradiation, FDSOI, flip flop, device simulation, 
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