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IEICE Trans

Kengo NAKASHIMA

Single-Event-Upset Tolerant RS Flip-Flop with Small Area
Kazuteru NAMBA Kengo NAKASHIMA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/12/01
Vol. E93-D  No. 12  pp. 3407-3409
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
soft error, single-event-upset (SEU) tolerance, reset-set flip-flop (RS-FF), interlocking feedback loop, 
 Summary | Full Text:PDF