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IEICE Trans

Kazuya MAKABE

Efficient Application of Hot-Carrier Reliability Simulation to Delay Library Screening for Reliability of Logic Designs
Hisako SATO Mariko OHTSUKA Kazuya MAKABE Yuichi KONDO Kazumasa YANAGISAWA Peter M. LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/05/01
Vol. E86-C  No. 5  pp. 842-849
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hot-carrier, circuit reliability, simulation, delay library, logic design, 
 Summary | Full Text:PDF