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IEICE Trans

Kazumitsu YASUDA

The Enhancement of Electromigration Lifetime under High Frequency Pulsed Conditions
Kazunori HIRAOKA Kazumitsu YASUDA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1  pp. 195-203
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Reliability Testing
Keyword: 
fault analysis, testing and verification, reliability, availability and vulnerability, 
 Summary | Full Text:PDF