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IEICE Trans

Kayoko SETO

Look-Ahead Dynamic Threshold Voltage Control Scheme for Improving Write Margin of SOI-7T-SRAM
Masaaki IIJIMA Kayoko SETO Masahiro NUMA Akira TADA Takashi IPPOSHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/12/01
Vol. E90-A  No. 12  pp. 2691-2694
Type of Manuscript:  Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Memory Design and Test
Keyword: 
PD-SOI, body-bias, SRAM, low power design, 
 Summary | Full Text:PDF