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IEICE Trans

Jung Hun OH

Studies on Modification of Channel Material and Gate Recess Structures in Metamorphic HEMT for Improvement of Breakdown and RF Characteristics
Seok Gyu CHOI Young Hyun BAEK Jung Hun OH Min HAN Seok Ho BANG Jin-Koo RHEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 683-687
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
metamorphic HEMT, InP-composite channel MHEMT, gate recess, impact ionization effect, 
 Summary | Full Text:PDF
Comparative Study on Breakdown Characteristics for InGaAs Metamorphic High Electron Mobility Transistor and InGaAs/InP-Composite Channel Metamorphic High Electron Mobility Transistor
Seok Gyu CHOI Jung Hun OH Bok Hyung LEE Byeong Ok LIM Sung Woon MOON Dong Hoon SHIN Sam Dong KIM Jin Koo RHEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/05/01
Vol. E89-C  No. 5  pp. 616-621
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Compound Semiconductor Devices
Keyword: 
MHEMT, InP-composite channel, impact ionization coefficient, output conductance, 
 Summary | Full Text:PDF | (Errata(Uploaded on July 1,2006))