Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2013/12/01 Vol. E96-ANo. 12pp. 2561-2567 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Logic Synthesis, Test and Verification Keyword: open faults, adjacent lines, test pattern generation, coupling capacitance, SAT-based ATPG,