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IEICE Trans

Jun QIAN

On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption
Yucong ZHANG Stefan HOLST Xiaoqing WEN Kohei MIYASE Seiji KAJIHARA Jun QIAN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2021/06/01
Vol. E104-D  No. 6  pp. 816-827
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testing, shift switching activity, IR-drop, shift failure, partial-shift, scan chain grouping, local shift switching activity, 
 Summary | Full Text:PDF