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IEICE Trans

Jesus A. del ALAMO

Hydrogen Degradation of InP HEMTs and GaAs PHEMTs
Jesus A. del ALAMO Roxann R. BLANCHARD Samuel D. MERTENS 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/10/01
Vol. E84-C  No. 10  pp. 1289-1293
Type of Manuscript:  INVITED PAPER (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000 (Topical Workshop on Heterostructure Microelectronics 2000))
Category: Hetero-FETs & Their Integrated Circuits
Keyword: 
high-electron mobility transistor, hydrogen, reliability, InP, GaAs, 
 Summary | Full Text:PDF