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IEICE Trans

Jesse P. RODRIGUES

Reliability of AlGaAs and InGaP Heterojunction Bipolar Transistors
Noren PAN Roger E. WELSER Charles R. LUTZ James ELLIOT Jesse P. RODRIGUES 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/11/25
Vol. E82-C  No. 11  pp. 1886-1894
Type of Manuscript:  INVITED PAPER (Special Issue on High-Frequency/High-Speed Devices for Information and Communication Systems in the 21st Century)
Category: RF Power Devices
Keyword: 
HBT, InGaP/GaAs HBTs, AlGaAs/GaAs HBTs, MOCVD, reliability, microwave devices, 
 Summary | Full Text:PDF