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IEICE Trans

Jeffrey FREY

An Integrated Efficient Method for Deep-Submicron EPROM/Flash Device Simulation Using Energy Transport Model
Jack Zezhong PENG Steve LONGCOR Jeffrey FREY 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2  pp. 166-173
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Device Simulation
Keyword: 
EPROM/Flash device, simulation, energy transport, hot electron injection, EPROM modeling, 
 Summary | Full Text:PDF