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IEICE Trans

Jean-Luc DANGER

Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage
Daisuke FUJIMOTO Noriyuki MIURA Makoto NAGATA Yuichi HAYASHI Naofumi HOMMA Takafumi AOKI Yohei HORI Toshihiro KATASHITA Kazuo SAKIYAMA Thanh-Ha LE Julien BRINGER Pirouz BAZARGAN-SABET Shivam BHASIN Jean-Luc DANGER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4  pp. 272-279
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
information leakage, side-channel attack, correlation power analysis, advance encryption standard, 
 Summary | Full Text:PDF