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IEICE Trans

Jacob A. ABRAHAM

Delay Defect Diagnosis Methodology Using Path Delay Measurements
Eun Jung JANG Jaeyong CHUNG Jacob A. ABRAHAM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/10/01
Vol. E98-C  No. 10  pp. 991-994
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
VLSI testing, delay faults, delay defects, defect diagnosis, fault localization, 
 Summary | Full Text:PDF