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IEICE Trans

Ingeol LEE

Built-In Self-Test for Static ADC Testing with a Triangle-Wave
Incheol KIM Ingeol LEE Sungho KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/02/01
Vol. E96-C  No. 2  pp. 292-294
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
ADC, BIST, static test, triangle-wave, 
 Summary | Full Text:PDF