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IEICE Trans

Hyunwook SON

Pattern Mapping Method for Low Power BIST Based on Transition Freezing Method
Youbean KIM Jaewon JANG Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/03/01
Vol. E93-D  No. 3  pp. 643-646
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
BIST, low power BIST, design for testability, 
 Summary | Full Text:PDF
A New Scan Power Reduction Scheme Using Transition Freezing for Pseudo-Random Logic BIST
Youbean KIM Kicheol KIM Incheol KIM Hyunwook SON Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4  pp. 1185-1188
Type of Manuscript:  LETTER
Category: Computer Components
Keyword: 
low power BIST (Built-in Self Test), pseudo-random BIST, low power pattern generator, 
 Summary | Full Text:PDF