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IEICE Trans

Hoyoon JUN

Protection of On-chip Memory Systems against Multiple Cell Upsets Using Double-adjacent Error Correction Codes
Hoyoon JUN Yongsurk LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/03/01
Vol. E98-C  No. 3  pp. 267-274
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
soft error, multiple cell upsets, error correcting code, on-chip memories, 
 Summary | Full Text:PDF