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IEICE Trans

Hong LUO

Temperature-Aware NBTI Modeling Techniques in Digital Circuits
Hong LUO Yu WANG Rong LUO Huazhong YANG Yuan XIE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/06/01
Vol. E92-C  No. 6  pp. 875-886
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
negative bias temperature instability (NBTI), temperature, reliability, 
 Summary | Full Text:PDF