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IEICE Trans

Ho-Young CHA

Effects of Field Plate and Buried Gate Structures on Silicon Carbide Metal-Semiconductor Field-Effect Transistors
Jae-Gil LEE Chun-Hyung CHO Ho-Young CHA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5  pp. 842-845
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
buried gate, field plate, MESFET, silicon carbide, 
 Summary | Full Text:PDF
Errors in Pi-Coefficients Due to the Strain Effects in Resistor Stress Sensor on (001) Silicon
Chun-Hyung CHO Ho-Young CHA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/05/01
Vol. E94-C  No. 5  pp. 791-795
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
stress sensor, strain effects, (001) silicon, piezoresistive coefficients, 
 Summary | Full Text:PDF
4H-SiC Avalanche Photodiodes for 280 nm UV Detection
Ho-Young CHA Hyuk-Kee SUNG Hyungtak KIM Chun-Hyung CHO Peter M. SANDVIK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 648-650
Type of Manuscript:  BRIEF PAPER
Category: Compound Semiconductor Devices
Keyword: 
avalanche photodiode, silicon carbide, UV detection, 
 Summary | Full Text:PDF
Strain Effects in van der Pauw (VDP) Stress Sensor Fabricated on (111) Silicon
Chun-Hyung CHO Ginkyu CHOI Ho-Young CHA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5  pp. 640-643
Type of Manuscript:  BRIEF PAPER
Category: Sensors
Keyword: 
VDP (van der Pauw) strain effects (111) silicon stress sensors piezo-resistive coefficients, 
 Summary | Full Text:PDF