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IEICE Trans

Hitoshi ABIKO

Device-Deviation Tolerant Elastic-Vt CMOS Circuits with Fine-Grain Power Control Capability
Masayuki MIZUNO Hitoshi ABIKO Koichiro FURUTA Isami SAKAI Masakazu YAMASHINA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/09/25
Vol. E81-C  No. 9  pp. 1463-1472
Type of Manuscript:  Special Section PAPER (Special Issue on Novel VLSI Processor Architectures)
Category: 
Keyword: 
low-threshold voltage, leakage current, supply-voltage fluctuation, supply-voltage control, low power dissipation, 
 Summary | Full Text:PDF