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IEICE Trans

Hiroyuki TAKAOKA

Function Testing of Bipolar and MOS LSI Circuits with a Combined Stroboscopic SEM-Microcomputer System
Hiromu FUJIOKA Koji NAKAMAE Hiroyuki TAKAOKA Katsumi URA 
Publication:   IEICE TRANSACTIONS (1976-1990)
Publication Date: 1981/05/25
Vol. E64-E  No. 5  pp. 295-301
Type of Manuscript:  PAPER
Category: Semiconductors
Keyword: 
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