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IEICE Trans

Hirotaka AMASUGA

High Moisture Resistant and Reliable Gate Structure Design in High Power pHEMTs for Millimeter-Wave Applications
Hirotaka AMASUGA Toshihiko SHIGA Masahiro TOTSUKA Seiki GOTO Akira INOUE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C  No. 5  pp. 676-682
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
millimeter-wave, GaAs, pHEMT, humidity, power density, breakdown voltage, 
 Summary | Full Text:PDF