IEICE Trans

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IEICE Trans

Hiroaki HAZAMA

FOREWORD Hiroaki HAZAMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/05/01 Vol. E85-C No. 5 pp. 1124-1124 Type of Manuscript: FOREWORD Category: Keyword:
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A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices Toshihiko HIMENO Naohiro MATSUKAWA Hiroaki HAZAMA Koji SAKUI Masamitsu OSHIKIRI Kazunori MASUDA Kazushige KANDA Yasuo ITOH Jin-ichi MIYAMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-C No. 2 pp. 145-151 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: flash memory, V_th distribution, reliability, NAND flash, nonvolatile memory,
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Electrical Properties and Technological Perspectives of Thin-Film SOI MOSFETs Makoto YOSHIMI Minoru TAKAHASHI Shigeru KAMBAYASHI Masato KEMMOCHI Hiroaki HAZAMA Tetsunori WADA Koichi KATO Hiroyuki TANGO Kenji NATORI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1991/02/25 Vol. E74-C No. 2 pp. 337-351 Type of Manuscript: INVITED PAPER Category: Keyword:
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