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IEICE Trans

Hideo SAKAI

High-Frequency Precise Characterization of Intrinsic FinFET Channel
Hideo SAKAI Shinichi O'UCHI Takashi MATSUKAWA Kazuhiko ENDO Yongxun LIU Junichi TSUKADA Yuki ISHIKAWA Tadashi NAKAGAWA Toshihiro SEKIGAWA Hanpei KOIKE Kunihiro SAKAMOTO Meishoku MASAHARA Hiroki ISHIKURO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4  pp. 752-760
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
FinFET, SOI, De-embedding, RF, device modeling, 
 Summary | Full Text:PDF