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Non Destructive Evaluation in Multilayer Structure Using the High Tc SQUID
Hideaki NAKANE | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/02/01
Vol. E88-C
No. 2
pp. 188-191
Type of Manuscript:
Special Section PAPER (Special Section on Superconducting Electronic Devices and Their Applications)
Category: SQUIDs
Keyword:
high Tc SQUID, eddy current nondestructive testing, phase shift, | | | Summary | Full Text:PDF | |
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Josephson Current Injection Interferometer Logic Circuit with Offset Bias
Yutaka HARADA Hideaki NAKANE Nobuo KOTERA Mikio HIRANO | Publication: IEICE TRANSACTIONS (1976-1990)
Publication Date: 1985/04/25
Vol. E68-E
No. 4
pp. 215-218
Type of Manuscript:
PAPER
Category: Integrated Circuits
Keyword:
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