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IEICE Trans

Hartmut DETTMER

On the Origin of Tunneling Currents in Scaled Silicon Devices
Andreas SCHENK Ulrich KRUMBEIN Stephan MÜLLER Hartmut DETTMER Wolfgang FICHTNER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2  pp. 148-154
Type of Manuscript:  Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93))
Category: Device Modeling
Keyword: 
integrated electronics, semiconductor materials and devices, quantum electronics, 
 Summary | Full Text:PDF