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IEICE Trans

Gang JIN

Simulation Study and SPICE Modeling of Single-Event Transients Induced by Secondary Ions Not Incident to the Drain in Nanoscale CMOS Technology
Hao WU Guanghui SHI Gang JIN Tengyue YI Yiqi ZHUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2026/07/01
Vol. E109-C  No. 7  pp. 257-266
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
single event transient, single event effect, neutron, secondary ion, TCAD, 
 Summary | Full Text:PDF
CAA-Net: End-to-End Two-Branch Feature Attention Network for Single Image Dehazing
Gang JIN Jingsheng ZHAI Jianguo WEI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2023/01/01
Vol. E106-A  No. 1  pp. 1-10
Type of Manuscript:  PAPER
Category: Digital Signal Processing
Keyword: 
end-to-end, two-branch feature attention network, single image dehazing, residual dense block, all branch prediction results, 
 Summary | Full Text:PDF
A 3D RRAM Using a Stackable Multi-Layer 1TXR Cell
Ji ZHANG Yiqing DING Xiaoyong XUE Gang JIN Yuxin WU Yufeng XIE Yinyin LIN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/12/01
Vol. E93-C  No. 12  pp. 1692-1699
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
3D, RRAM, 1TXR, 
 Summary | Full Text:PDF