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IEICE Trans

Fumio OTSUKA

Response Surface Methods for Submicron MOSFETs Characterization with Variable Transformation Technology
Hiroo MASUDA Fumio OTSUKA Yukio AOKI Shoji SATO Shozo SHIMADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1991/06/25
Vol. E74-C  No. 6  pp. 1621-1633
Type of Manuscript:  Special Section PAPER (Special Issue on Device and Process Simulation for Ultra Large Scale Integration)
Category: 
Keyword: 
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